The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...
The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...
Abstract: Gate bounded diode triggered high holding voltage SCR ESD clamp for high voltage application is proposed in this paper. A straight-forward gate bounded diode for low triggering voltage can ...
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